Microscopy of pentacene thin films

, &
Philosophical Magazine 87 (2):253-266 (2007)
  Copy   BIBTEX

Abstract

This article has no associated abstract. (fix it)

Categories

Add categories

Keywords

Reprint years

DOI

10.1080/14786430600953756

Links

PhilArchive



    Upload a copy of this work     Papers currently archived: 93,891

External links

Setup an account with your affiliations in order to access resources via your University's proxy server

Through your library

My notes

Similar books and articles

Study of thin amorphous and crystalline carbon films by electron microscopy.A. Oberlin, M. Oberlin & M. Maubois - 1975 - Philosophical Magazine 32 (4):833-846.
Transmission electron microscopy studies on structure and defects in crystalline yttria and lanthanum oxide thin films grown on single crystal sapphire by molecular beam synthesis.Masaru Tsuchiya, Nestor A. Bojarczuk, Supratik Guha & Shriram Ramanathan - 2010 - Philosophical Magazine 90 (9):1123-1139.
Interference Effects in the Electron Microscopy of Thin Crystal Foils.W. Bollmann - 2006 - Philosophical Magazine 86 (29-31):4573-4574.
Comment on 'Oriented domains in a thin film of La 0.8 Sr 0.2 MnO 3 prepared by laser molecular-beam epitaxy' by X. L. Ma, Y. L. Zhu, X. M. Meng, H. B. Lu, F. Chen, Z. H. Chen, G. Z. Yang and Z. Zhang. [REVIEW]Ian Maclaren - 2003 - Philosophical Magazine 83 (7):929-931.
On dislocation loss in thin film electron microscopy of polycrystalline copper.C. T. B. Foxon & J. G. Rider - 1968 - Philosophical Magazine 17 (148):729-734.
The determination of dislocation densities in thin films.R. K. Ham - 1961 - Philosophical Magazine 6 (69):1183-1184.
Evaluation of dislocation energy in thin films.R. A. Coppeta, D. Holec, H. Ceric & T. Grasser - 2015 - Philosophical Magazine 95 (2):186-209.
Microstructure of annealed Ti48.5NiCux thin films.A. Ishida, M. Sato & K. Ogawa - 2008 - Philosophical Magazine 88 (16):2427-2438.
Strains and rotations in thin deposited films.J. P. Hirth & R. C. Pond - 2010 - Philosophical Magazine 90 (23):3129-3147.
Anisotropy in the resistivity of thin aluminium films.R. Risnes & V. Sollien - 1969 - Philosophical Magazine 20 (167):895-905.

Analytics

Added to PP
2016-06-30

Downloads
7 (#1,405,108)

6 months
5 (#837,449)

Historical graph of downloads
How can I increase my downloads?

Author's Profile

Citations of this work

No citations found.

Add more citations

References found in this work

No references found.

Add more references