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  1. The development and early applications of the weak-beam technique.M. J. Whelan - 2010 - Philosophical Magazine 90 (35-36):4611-4622.
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  • The electron microscope image contrast near dislocation nodes.A. M. B. Shaw & L. M. Brown - 1967 - Philosophical Magazine 15 (136):797-804.
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  • Chemical bonding and structure of the semiconductor compounds.R. J. Caveney - 1968 - Philosophical Magazine 17 (149):943-949.
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  • On the stacking-fault energies of copper alloys.C. B. Carter & I. L. F. Ray - 1977 - Philosophical Magazine 35 (1):189-200.
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  • Zigzag lines in a Si low-angle twist boundary.A. Boussaid, M. Fnaiech, F. Fournel & R. Bonnet * - 2005 - Philosophical Magazine 85 (11):1111-1122.
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  • Electron microscopy and diffraction of synthetic corundum crystals.D. J. Barber & Nancy J. Tighe - 1966 - Philosophical Magazine 14 (129):531-544.
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