A study of the relationship between lattice fringes and lattice planes in electron microscope images of crystals containing defects

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Philosophical Magazine 24 (187):139-153 (1971)
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10.1080/14786437108216429

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The structure of amorphous Si and Ge.M. L. Rudee & A. Howie - 1972 - Philosophical Magazine 25 (4):1001-1007.
The development and early applications of the weak-beam technique.M. J. Whelan - 2010 - Philosophical Magazine 90 (35-36):4611-4622.

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